H. Francis Webster

My undergraduate research students routinely use a wide array of instrumentation in their work, some of which is not commonly found at undergraduate institutions. In addition to the instrumentation at Radford, we use the facilities at the NCLS (Nanoscale Characterization and Fabrication Laboratory ) laboratory facilities at Virginia Tech for SEM, XPS, and AFM analysis.

RU Chemistry

• Dynamic Light Scattering –DynaPro NanoStar (Wyatt Technologies)
• Differential Scanning Calorimetry – Q20 DSC (TA Instruments)
• Thermal gravimetric analysis – Q50 TGA (TA Instruments)
• Isothermal Titration calorimetry – Nano ITC (TA Instruments)
• Elemental analysis – FLASH 2000 Series CHNS/O Analyzer (Thermo)
• Surface area and pore size distribution analysis – NOVA 2200e (Quantachrome)
• Infrared spectroscopy (ATR, RAS) – (Varian 3100 FTIR)
• High performance liquid chromatography w/ ELSD detector – Prominence (Shimadzu)
• Gas chromatography – GC 2010 (Shimadzu)
• Inductively coupled plasma emission spectroscopy – ICPE 9000 (Shimadzu)
• Atomic absorption spectroscopy – 240FS AA (Agilent)
• Uv-vis spectroscopy – 8453 Diode array system (Agilent)
• Microwave assisted synthesis – MARS system (CEM Corporation)
• Conventional synthesis – 4590 micro stirred reactor (Parr Instruments)

RU Biology

• Fluorescence microscopy – Eclipse 80i (Nikon)

NCFL – Virginia Tech

• X-ray photoelectron spectroscopy – PHI Quanterra SXM
• Scanning electron microscopy – LEO (Zeiss) 1550 field emission SEM
• Atomic force microscopy – Veeco multimode AFM